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Electrical characteristics of Al/SiO2/n-Si tunnel diodes with an oxide layer grown by rapid thermal oxidation

✍ Scribed by M. Depas; R.L. Van Meirhaeghe; W.H. Laflère; F. Cardon


Publisher
Elsevier Science
Year
1994
Tongue
English
Weight
828 KB
Volume
37
Category
Article
ISSN
0038-1101

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