Electrical characteristics of Al/SiO2/n-Si tunnel diodes with an oxide layer grown by rapid thermal oxidation

✍ Scribed by M. Depas; R.L. Van Meirhaeghe; W.H. Laflère; F. Cardon

• Publisher: Elsevier Science
• Year: 1994
• Tongue: English
• Weight: 828 KB
• Volume: 37
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/0038-1101(94)90009-4