Electrical characteristics due to differences in crystal damage induced by various implant conditions

✍ Scribed by G. Fuse; M. Sano; H. Murooka; T. Yagita; M. Kabasawa; T. Siraishi; Y. Fujino; N. Suetsugu; H. Kariya; H. Izutani; M. Sugitani

• Book ID: 118492093
• Publisher: Elsevier Science
• Year: 2005
• Tongue: English
• Weight: 316 KB
• Volume: 237
• Category: Article
• ISSN: 0168-583X
• DOI: 10.1016/j.nimb.2005.04.081