✦ LIBER ✦
Electrical characterisation of thin silicon layers by light beam induced current and internal quantum efficiency measurements
✍ Scribed by Y. Sayad; S. Amtablian; A. Kaminski; D. Blanc; P. Carroy; A. Nouiri; M. Lemiti
- Book ID
- 108215655
- Publisher
- Elsevier Science
- Year
- 2009
- Tongue
- English
- Weight
- 458 KB
- Volume
- 165
- Category
- Article
- ISSN
- 0921-5107
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