Electrical approach to defect depth estimation by stepped infrared thermography

✍ Scribed by Gupta, R.; Tuli, S.

• Book ID: 114457262
• Publisher: The Institution of Electrical Engineers
• Year: 2004
• Tongue: English
• Weight: 346 KB
• Volume: 151
• Category: Article
• ISSN: 1350-2344
• DOI: 10.1049/ip-smt:20040564