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Electrical and structural investigations of Ag-based Ohmic contacts for InAlAsâInGaAsâInP high electron mobility transistors

✍ Scribed by Zhao, Weifeng; Wang, Liang; Adesida, Ilesanmi

No coin nor oath required. For personal study only.

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Stability and noise of PdGeAgAu ohmic

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Electrical and structural investigations of Ag-based Ohmic contacts for InAlAsâInGaAsâInP high electron mobility transistors