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Electrical and morphological change of Ag–Ni films by annealing in vacuum

✍ Scribed by M. Kawamura; M. Yamaguchi; Y. Abe; K. Sasaki


Publisher
Elsevier Science
Year
2005
Tongue
English
Weight
271 KB
Volume
82
Category
Article
ISSN
0167-9317

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We report on the effect of pressure, ageing and in situ annealing on the electrical resistivity and temperature coefficient of resistance in thin samarium films over the thickness range lOiN A. On annealing at 180°C for 2 h. film resistivity increases for lower thicknesses but remains constant for h