Electrical and material characterization of tantalum pentoxide (Ta2O5) charge trapping layer memory

✍ Scribed by Hsiang Chen

• Publisher: Elsevier Science
• Year: 2011
• Tongue: English
• Weight: 703 KB
• Volume: 257
• Category: Article
• ISSN: 0169-4332
• DOI: 10.1016/j.apsusc.2011.03.055