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Electric field-induced rearrangement of charged species in metal oxide devices with resistive change: thermodynamic limitations

✍ Scribed by I. Kiselev; M. Sommer; V. V. Sysoev

Book ID: 111623797
Publisher: Springer
Year: 2011
Tongue: English
Weight: 269 KB
Volume: 82
Category: Article
ISSN: 1434-6036
DOI: 10.1140/epjb/e2011-20176-0

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