✦ LIBER ✦
Electric-field-enhanced emission and annealing behaviour of electron traps introduced in n-Si by low-energy He ion bombardment
✍ Scribed by Deenapanray, P N K; Meyer, W E; Auret, F D
- Book ID
- 127210107
- Publisher
- Institute of Physics
- Year
- 1999
- Tongue
- English
- Weight
- 162 KB
- Volume
- 14
- Category
- Article
- ISSN
- 0268-1242
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