Electric conductivity enhancement and la
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Yunlong Cui; Senhao Lin; Tingwen Rong; Jingrong Bao; Lansun Zheng; Chaoyang Liu
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Article
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1994
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Elsevier Science
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English
⚖ 413 KB
Pristine CsO films, which were sublimed onto Si( loo), were implanted with 20 keV K+ ions at a dose of 2.7x 1016/cm2. The distribution of K+ and contamination of oxygen were studied using Rutherford backscattering. The four-probe technique was used to measure the sheet resistance of the films, and t