Determination of the inelastic mean free
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G Gergely; A Konkol; M Menyhard; B Lesiak; A Jablonski; D Varga; J Toth
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Article
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1997
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Elsevier Science
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English
β 380 KB
The IMFP of electrons is a fundamental material parameter of surface analysis by AES, XPS, EPES and EELS. In surface analysis calculated IMFP values are used. Their experimental determination is rather difficult The IMFP of amorphous Ge and polycrysralline Si was determined by comparing rhe elastic