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EL2 and gallium antisite defects in GaAs: Si

✍ Scribed by Teh, C. K.; Weichman, F. L.; Tin, C. C.; Barnes, P. A.

Book ID: 126980398
Publisher: NRC Research Press
Year: 1989
Tongue: English
Weight: 278 KB
Volume: 67
Category: Article
ISSN: 0008-4204
DOI: 10.1139/p89-066

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