𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Efficient rendering of multiresolution meshes with guaranteed image quality

✍ Scribed by Reinhard Klein; Andreas Schilling


Book ID
106047375
Publisher
Springer
Year
1999
Tongue
English
Weight
351 KB
Volume
15
Category
Article
ISSN
0178-2789

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Quality assessment of atomic force micro
✍ Taatjes, Douglas J.; Quinn, Anthony S.; Lewis, Michael R.; Bovill, Edwin G. πŸ“‚ Article πŸ“… 1999 πŸ› John Wiley and Sons 🌐 English βš– 855 KB

While image quality from instruments such as electron microscopes, light microscopes, and confocal laser scanning microscopes is mostly influenced by the alignment of optical train components, the atomic force microscope differs in that image quality is highly dependent upon a consumable component,