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Efficient critical area measurements of IC layout applied to quality and reliability enhancement

✍ Scribed by Gerard A. Allan; Anthony J. Walton

Book ID: 108362203
Publisher: Elsevier Science
Year: 1997
Tongue: English
Weight: 758 KB
Volume: 37
Category: Article
ISSN: 0026-2714
DOI: 10.1016/s0026-2714(97)00021-8

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