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Efficiency of radiation defect formation in silicon at various intensities of electron and γ-ray irradiation

✍ Scribed by Lugakov, P. F. ;Lukyanitsa, V. V.

Publisher: John Wiley and Sons
Year: 1984
Tongue: English
Weight: 560 KB
Volume: 83
Category: Article
ISSN: 0031-8965
DOI: 10.1002/pssa.2210830213

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