Effects of Weibull hazard rate on common cause failure analysis of reliability networks : Balbir S. Dhillon. Microelectron. Reliab. 17, 59 (1978)

• Publisher: Elsevier Science
• Year: 1978
• Tongue: English
• Weight: 119 KB
• Volume: 17
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(78)90369-4