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Effects of uniaxial stress on the Raman frequencies of Ti2O3 and Al2O3

✍ Scribed by S.H. Shin; Fred Pollak; Paul M. Raccah


Publisher
Elsevier Science
Year
1975
Tongue
English
Weight
71 KB
Volume
12
Category
Article
ISSN
0022-4596

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Laser Raman spectroscopy (LRS), X-ray di4raction (XRD), X-ray photoelectron spectroscopy (XPS), ultraviolet and di4use re6ectance spectroscopy (UV-DRS), and temperature-programmed reduction (TPR) are used to characterize a series of TiO 2 / -Al 2 O 3 , NiO/ -Al 2 O 3 , and NiO/TiO 2 / -Al 2 O 3 samp