Effects of Ti top electrode thickness on the resistive switching behaviors of rf-sputtered ZrO[sub 2] memory films

✍ Scribed by S. Wang; D. Lee; T. Tseng; C. Lin

• Book ID: 121736890
• Publisher: American Institute of Physics
• Year: 2009
• Tongue: English
• Weight: 512 KB
• Volume: 95
• Category: Article
• ISSN: 0003-6951
• DOI: 10.1063/1.3231872