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Effects of thin-film thermal conductivity on the optical damage threshold of a-Si film on c-Si substrate at 1064 nm

✍ Scribed by Kuo, B. S. W.; Schmid, A. W.


Book ID
121224974
Publisher
American Institute of Physics
Year
1993
Tongue
English
Weight
882 KB
Volume
74
Category
Article
ISSN
0021-8979

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Thermal conductivity and interface therm
✍ B. S. W. Kuo; J. C. M. Li; A. W. Schmid πŸ“‚ Article πŸ“… 1992 πŸ› Springer 🌐 English βš– 860 KB

An in situ, noncontact, photothermal displacement interferometer for performing thermal diffusivity measurements on bulk and thin-fihn materials has been developed. Localized transient surface motion is generated through photothermoelastic coupling of a pulsed, heating laser beam to the sample under