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Effects of Thermal Annealing on the Structure of Ferroelectric Thin Films

✍ Scribed by Jiang-Li Cao; Axel Solbach; Uwe Klemradt; Thomas Weirich; Joachim Mayer; Ulrich Böttger; Ulrich Ellerkmann; Peter J. Schorn; Peter Gerber; Rainer Waser

Book ID: 109259687
Publisher: John Wiley and Sons
Year: 2006
Tongue: English
Weight: 464 KB
Volume: 89
Category: Article
ISSN: 0002-7820
DOI: 10.1111/j.1551-2916.2005.00885.x

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