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Effects of the integrity of silicon thin films on the electrical characteristics of thin dielectric ONO film

✍ Scribed by DONG-WON KIM; KAP-JUNG KIM; DONG-IL KIM; WON-JUN LEE; SEUNG-YUN LEE; YOUNG J LEE; SA-KYUN RHA; CHONG-OOK PARK

No coin nor oath required. For personal study only.

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