Effects of test capability on system reliability and availability : G. R. Compton, R. S. Pringle and P. H. Mueggler. IEEE Trans. Reliab. R-21, No. 4, November (1972), p. 239

• Publisher: Elsevier Science
• Year: 1973
• Tongue: English
• Weight: 212 KB
• Volume: 12
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(73)90512-x