✦ LIBER ✦
Effects of surface smoothness and deposition temperature of floating gates in flash memory devices to oxide/nitride/oxide interpoly dielectric breakdown
✍ Scribed by C. L. Cha; E. F. Chor; H. Gong; L. Chan
- Book ID
- 110240537
- Publisher
- Springer
- Year
- 2000
- Tongue
- English
- Weight
- 507 KB
- Volume
- 19
- Category
- Article
- ISSN
- 0261-8028
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