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Effects of stacking faults on refinement of single crystal X-ray diffraction data for Sr5Ir3O11

✍ Scribed by R.L. Harlow; Z.G. Li; W.J. Marshall; M.K. Crawford; M.A. Subramanian

Book ID: 113188905
Publisher: Elsevier Science
Year: 1995
Tongue: English
Weight: 790 KB
Volume: 30
Category: Article
ISSN: 0025-5408
DOI: 10.1016/0025-5408(94)00120-0

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