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Effects of silyl concentration, hydrogen concentration, ion flux, and silyl surface diffusion length on microcrystalline silicon film growth

✍ Scribed by Shutang Wen; Liwei Zhang; Jingxiao Lu; Yuxiao Li; Zhiyong Du


Book ID
107514071
Publisher
Springer US
Year
2008
Tongue
English
Weight
407 KB
Volume
25
Category
Article
ISSN
0256-1115

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