✦ LIBER ✦
Effects of silicon layer properties on device reliability for 0.1-μm SOI n-MOSFET design strategies
✍ Scribed by Hulfachor, R.B.; Kim, K.W.; Littlejohn, M.A.; Osburn, C.M.
- Book ID
- 114536791
- Publisher
- IEEE
- Year
- 1997
- Tongue
- English
- Weight
- 194 KB
- Volume
- 44
- Category
- Article
- ISSN
- 0018-9383
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