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Effects of repeat unit structure on the toughness of poly(aryl ether sulphone)s

โœ Scribed by T.E. Attwood; M.B. Cinderey; J.B. Rose

Book ID
107846915
Publisher
Elsevier Science
Year
1993
Tongue
English
Weight
243 KB
Volume
34
Category
Article
ISSN
0032-3861

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A Raman spectroscopic method has been developed that allows the precise and rapid determination of the degree of sulphonation (DS) of sulphonated poly(aryl ether sulphone). The calibration samples were characterized extensively by several independent reference techniques. It was possible to identify