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Effects of Quasiparticle Recombination and Photoelectron Escape in Al-Superconducting Tunnel Junction Detectors

✍ Scribed by G. Angloher; M. Huber; J. Jochum; F. von Feilitzsch; R. L. Mößbauer; G. Sáfrán


Book ID
110365096
Publisher
Springer US
Year
2001
Tongue
English
Weight
283 KB
Volume
123
Category
Article
ISSN
0022-2291

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