Analysis of the projectile track chargin
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T. Jalowy; L.S. Farenzena; M. Hattass; E.F. da Silveira; H. Schmidt-Böcking; K.O
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Article
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2004
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Elsevier Science
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English
⚖ 547 KB
Secondary ions, emitted from LiF, Al (covered with layers of Al 2 O 3 ) and Au bombarded by a MeV argon (25 keV/u) beam, are analyzed by a XY-TOF detection system. This new method allows, for each emitted ion, the simultaneous measurement of its time-of flight (TOF) and its impact coordinates (XY) o