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Effects of projectile track charging on the H− secondary ion velocity distribution

✍ Scribed by P. Iza; L.S. Farenzena; E.F. da Silveira


Publisher
Elsevier Science
Year
2007
Tongue
English
Weight
732 KB
Volume
256
Category
Article
ISSN
0168-583X

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Secondary ions, emitted from LiF, Al (covered with layers of Al 2 O 3 ) and Au bombarded by a MeV argon (25 keV/u) beam, are analyzed by a XY-TOF detection system. This new method allows, for each emitted ion, the simultaneous measurement of its time-of flight (TOF) and its impact coordinates (XY) o