Effects of Peierls barrier and epithreading dislocation orientation on the critical thickness in heteroepitaxial structures

✍ Scribed by Chidambarrao, D.; Srinivasan, G. R.; Cunningham, B.; Murthy, C. S.

• Book ID: 119941599
• Publisher: American Institute of Physics
• Year: 1990
• Tongue: English
• Weight: 700 KB
• Volume: 57
• Category: Article
• ISSN: 0003-6951
• DOI: 10.1063/1.103548