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Effects of nanoscale defects on critical current density of (Y1−xEux)Ba2Cu3O7−δ thin films

✍ Scribed by R. Goswami; T.J. Haugan; P.N. Barnes; G. Spanos; R.L. Holtz

Publisher
Elsevier Science
Year
2010
Tongue
English
Weight
789 KB
Volume
470
Category
Article
ISSN
0921-4534

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Critical currents in Y1Ba2Cu3O7−δ thin films containing screw dislocations
✍ H. Douwes; P.H. Kes; Ch. Gerber; J. Mannhart 📂 Article 📅 1993 🏛 Elsevier Science 🌐 English ⚖ 561 KB

Flux pinning by screw dislocations and (oxygen) vacancies is considered in Y1Ba2Cu3OT\_6 thin films. Expressions for the corresponding elementary pinning forces are given and estimates concerning their strengths are made. It is supposed that the screw dislocations are the predominant pinning mechani