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Effects of N-H2doses in ion-implanted bubble memory test chips

✍ Scribed by Nelson, T.; Ballintine, J.; Reith, L.; Roman, B.; Slusky, S.; Wolfe, R.

Book ID: 114646109
Publisher: IEEE
Year: 1982
Tongue: English
Weight: 330 KB
Volume: 18
Category: Article
ISSN: 0018-9464
DOI: 10.1109/tmag.1982.1062015

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