Effects of Moisture and Hydrogen Exposure on Radiation-Induced MOS Device Degradation and Its Implications for Long-Term Aging

✍ Scribed by Schwank, James R.; Shaneyfelt, Marty R.; Dasgupta, Aritra; Francis, S. A.; Zhou, Xing J.; Fleetwood, Daniel M.; Schrimpf, Ronald D.; Pantelides, Sokrates T.; Felix, James A.; Dodd, Paul E.; Ferlet-Cavrois, Veronique; Paillet, Philippe; Dalton, Scott M.; Swanson, Scot E.; Hash, Gerald L.; Thornberg, Steve M.; Hochrein, James M.; Lum, Gary K.

• Book ID: 118042758
• Publisher: IEEE
• Year: 2008
• Tongue: English
• Weight: 886 KB
• Volume: 55
• Category: Article
• ISSN: 0018-9499
• DOI: 10.1109/tns.2008.2005676