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Effects of LaNiO[sub 3] bottom electrode on structural and dielectric properties of CaCu[sub 3]Ti[sub 4]O[sub 12] films fabricated by sol-gel method

✍ Scribed by Li, Y. W.; Hu, Z. G.; Sun, J. L.; Meng, X. J.; Chu, J. H.

Book ID: 121527740
Publisher: American Institute of Physics
Year: 2008
Tongue: English
Weight: 408 KB
Volume: 92
Category: Article
ISSN: 0003-6951
DOI: 10.1063/1.2837534

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