Effects of junction resistance and counterelectrode material on point-contact tunneling into single- and polycrystalline YBa2Cu3O7−y

✍ Scribed by E. R. Moog; M. E. Hawley; K. E. Gray; J. Z. Liu; D. G. Hinks; D. W. Capone; J. Downey

• Book ID: 104627067
• Publisher: Springer US
• Year: 1988
• Tongue: English
• Weight: 428 KB
• Volume: 71
• Category: Article
• ISSN: 0022-2291
• DOI: 10.1007/bf00116870