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Effects of irradiation temperature on MOS radiation response

✍ Scribed by Shaneyfelt, M.R.; Schwank, J.R.; Fleetwood, D.M.; Winokur, P.S.

Book ID: 121481744
Publisher: IEEE
Year: 1998
Tongue: English
Weight: 753 KB
Volume: 45
Category: Article
ISSN: 0018-9499
DOI: 10.1109/23.685209

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