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Effects of intrinsic stress on submicrometer Nb/AlOx/Nb Josephson junctions

✍ Scribed by Imamura, T.; Hasuo, S.

Book ID: 114549863
Publisher: IEEE
Year: 1989
Tongue: English
Weight: 385 KB
Volume: 25
Category: Article
ISSN: 0018-9464
DOI: 10.1109/20.92486

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