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Effects of interface geometry on the thermoelectric properties of laterally microstructured ZnO-based thin films

✍ Scribed by Homm, G.; Gather, F.; Kronenberger, A.; Petznick, S.; Henning, T.; Eickhoff, M.; Meyer, B. K.; Heiliger, C.; Klar, P. J.

No coin nor oath required. For personal study only.

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