✦ LIBER ✦
Effects of grain size and plasma-induced modification of the dielectric on the mobility and stability of bottom gate microcrystalline silicon TFTs
✍ Scribed by S. Kasouit; P. Roca i Cabarrocas; R. Vanderhaghen; Y. Bonnassieux; M. Elyaakoubi; I.D. French
- Book ID
- 116667721
- Publisher
- Elsevier Science
- Year
- 2004
- Tongue
- English
- Weight
- 379 KB
- Volume
- 338-340
- Category
- Article
- ISSN
- 0022-3093
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