Atomic Force Microscopy Studies of Membr
β
W. Richard Bowen; Teodora A. Doneva
π
Article
π
2000
π
Elsevier Science
π
English
β 134 KB
Atomic force microscopy in conjunction with the colloid (silica) probe technique has been used to quantify the variations in electrical double-layer interactions and adhesion at different locations on a rough reverse osmosis membrane (AFC99) surface in NaCl solutions. Prior scanning of the membrane