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Effects of electric and mechanical loads on the morphological evolution of a void in piezoelectric films

✍ Scribed by Y. Liu; X. Wang; H. Wang; Z. Li

Book ID: 108057128
Publisher: Elsevier Science
Year: 2011
Tongue: English
Weight: 419 KB
Volume: 35
Category: Article
ISSN: 0307-904X
DOI: 10.1016/j.apm.2010.07.058

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