Defects in Cu(In, Ga) Se2 semiconductors
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M. Burgelman; F. Engelhardt; J. F. Guillemoles; R. Herberholz; M. Igalson; R. Kl
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Article
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1997
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John Wiley and Sons
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English
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This contribution is a summary of an international, interdisciplinary workshop dedicated to defects in chalcopyrite semiconductors and their relation to the device characteristics of thin-ยฎlm solar cells, held on 3ยฑ5 June 1996 in Oberstdorf, Germany. Results of dierent characterization methods were