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Effects of data conversion discreteness and malfunctions of automatic control devices upon the reliability of analog-to-digital testing

✍ Scribed by B. I. Dotsenko; Yu. I. Shepelev; M. Sh. Gel'medov


Publisher
Springer US
Year
1992
Tongue
English
Weight
229 KB
Volume
35
Category
Article
ISSN
0543-1972

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