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Effects of compressive stress on the electronic states and atomic configurations of the Pt–H2 defect in silicon

✍ Scribed by Yoichi Kamiura; Kimihiro Sato; Yoshifumi Yamashita; Takeshi Ishiyama


Book ID
103843607
Publisher
Elsevier Science
Year
2006
Tongue
English
Weight
341 KB
Volume
134
Category
Article
ISSN
0921-5107

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