Dielectric properties of Ca(Zr0.05Ti0.95
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L.S. Cavalcante; A.Z. SimΓ΅es; L.P.S. Santos; M.R.M.C. Santos; E. Longo; J.A. Var
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Article
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2006
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Elsevier Science
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English
β 273 KB
Ca(Zr 0.05 Ti 0.95 )O 3 (CZT) thin films were grown on Pt(1 1 1)/Ti/SiO 2 /Si(1 0 0) substrates by the soft chemical method. The films were deposited from spin-coating technique and annealed at 928 K for 4 h under oxygen atmosphere. CZT films present orthorhombic structure with a crack free and gran