Effects of capacitive coupling on the escape rate in intrinsic Josephson junction stacks
โ Scribed by Tomio Koyama; Masahiko Machida
- Book ID
- 108191570
- Publisher
- Elsevier Science
- Year
- 2008
- Tongue
- English
- Weight
- 199 KB
- Volume
- 69
- Category
- Article
- ISSN
- 0022-3697
No coin nor oath required. For personal study only.
๐ SIMILAR VOLUMES
We have theoretically investigated macroscopic quantum tunneling (MQT) for a stack of capacitively and inductively coupled intrinsic-junctions. By use of the functional integral method, we have analytically derived the MQT escape rate and found that the inductive coupling reduces the potential barri
We have solved numerically a system of dynamical equations for the gauge-invariant phase differences between superconducting layers for a stack of N intrinsic junctions and obtained a total branch structure in the current-voltage characteristics (IVC) of the stack. The coupling dependence of the bra