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Effects of burn-in and temperature cycling on the corrosion resistance of plastic encapsulated integrated circuits : C. M. Batley. 5th A. Proc. Reliab. Phys. IEEE, Nevada. p. 120 (1977)


Publisher
Elsevier Science
Year
1978
Tongue
English
Weight
94 KB
Volume
17
Category
Article
ISSN
0026-2714

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