Effects of Ar+ back-surface gettering on the properties of flicker noise in n-channel nitrided MOSFETs

✍ Scribed by C. Surya; W. Wang; W.K. Fong; C.H. Chan; P.T. Lai

• Publisher: Elsevier Science
• Year: 1996
• Tongue: English
• Weight: 349 KB
• Volume: 39
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/0038-1101(96)00069-x