Effective recognition of control chart patterns in autocorrelated data using a support vector machine based approach

✍ Scribed by Shih-Yen Lin; Ruey-Shiang Guh; Yeou-Ren Shiue

• Book ID: 113536675
• Publisher: Elsevier Science
• Year: 2011
• Tongue: English
• Weight: 512 KB
• Volume: 61
• Category: Article
• ISSN: 0360-8352
• DOI: 10.1016/j.cie.2011.06.025