Effective lifetime measurements in silicon-on-sapphire material by time-resolved reflectometry

✍ Scribed by A. Galeckas; V. Grivickas; M. Petrauskas; L. Frank; J.A. Tellefsen Jr.

• Publisher: Elsevier Science
• Year: 1990
• Tongue: English
• Weight: 434 KB
• Volume: 191
• Category: Article
• ISSN: 0040-6090
• DOI: 10.1016/0040-6090(90)90272-f